Publication overview
5876 publications found in Articles
Damage distribution and annealing behaviour of high energy 115In+ implanted into Si(100)
B.-X. Zhang, Z.L. Wang, R. Schreutelkamp, F.W. Saris, A.-Y. Du, Q. Li, Damage distribution and annealing behaviour of high energy 115In+ implanted into Si(100), Nucl. Instrum. Methods Phys. Res., Sect B 48, 425-430, (1990)
Low temperature epitaxial NiSi2 formation on Si(111) by diffusing Ni through amorphous Ni-Zr
R. Reus, H.C. Tissink, F.W. Saris, Low temperature epitaxial NiSi2 formation on Si(111) by diffusing Ni through amorphous Ni-Zr, J. Mater. Res. 5, 341-346, (1990)
Influence of pre-Gaussian noise on selective ionization
L.C. Winter, T.L. Weeding, Influence of pre-Gaussian noise on selective ionization, Phys. Rev. A 41, 1466-1471, (1990)
O2- formation at Si(001)
J.H. Rechtien, U. Imke, K.J. Snowdon, P.H.F. Reijnen, P.J. Hoek, A.W. Kleyn, O2- formation at Si(001), Surf. Sci. 227, 35-42, (1990)
Negative hydrogen ion densities and drift velocities in a multicusp ion source
P.J. Eenshuistra, M. Gochitashvilli, R. Becker, A.W. Kleyn, H.J. Hopman, Negative hydrogen ion densities and drift velocities in a multicusp ion source, J. Appl. Phys. 67, 85-96, (1990)
Thermal roughening studied by scanning tunneling microscopy
J.W.M. Frenken, R.J. Hamers, J.E. Demuth, Thermal roughening studied by scanning tunneling microscopy, J. Vac. Sci. Technol. A, 293-296, (1990)
Ultrafast relaxation of electrons probed by surface plasmons at a thin silver film
R.H.M. Groeneveld, R. Sprik, A. Lagendijk, Ultrafast relaxation of electrons probed by surface plasmons at a thin silver film, Phys. Rev. Lett. 64, 784-787, (1990)
Dissociation of small molecules: direct dissociation or statistical energy redistribution?
J.H.M. Beijersbergen, J.H. Los, Dissociation of small molecules: direct dissociation or statistical energy redistribution?, J. Phys. Chem. 94, 611-616, (1990)
Peak shape analysis for the determination of interface structure in reactive metallic bilayers: Pd on Al
R.J. Smith, A.W. Denier van der Gon, J.F. Veen, Peak shape analysis for the determination of interface structure in reactive metallic bilayers: Pd on Al, Nucl. Instrum. Methods Phys. Res., Sect B 45, 429-433, (1990)
Segregation at the clean and oxidized Pt0.5Ni0.5(111) surface studied by medium-energy ion scattering
S. Deckers, F.H.P.M. Habraken, W.F. Weg, A.W. Denier van der Gon, B. Pluis, J.F. Veen, Segregation at the clean and oxidized Pt0.5Ni0.5(111) surface studied by medium-energy ion scattering, Nucl. Instrum. Methods Phys. Res., Sect B 45, 416, (1990)
Direct inelastic scattering of superthermal Ar, CO, NO and O2 from Ag(111)
M.E.M. Spruit, P.J. Hoek, E.W. Kuipers, F.H. Geuzebroek, A.W. Kleyn, Direct inelastic scattering of superthermal Ar, CO, NO and O2 from Ag(111), Surf. Sci. 214, 591-615, (1989)
Dissociative adsorption of O2 on Ag(111)
M.E.M. Spruit, A.W. Kleyn, Dissociative adsorption of O2 on Ag(111), Chem. Phys. Lett. 159, 342-348, (1989)
Resonant multiphoton ionisation of xenon with high-intensity femtosecond pulses
Pierre Agostini, A. Antonetti, P. Breger, M. Crance, A. Migus, H.G. Muller, G. Petite, Resonant multiphoton ionisation of xenon with high-intensity femtosecond pulses, J. Phys. B: At., Mol. Opt. Phys. 22, 1971-1977, (1989)
The structure of the Si(111)(Ö3xÖ3)R30°-Sn surface determined using X-ray diffraction
K.M. Conway, J.E. MacDonald, C. Norris, E. Vlieg, J.F. Veen, The structure of the Si(111)(Ö3xÖ3)R30°-Sn surface determined using X-ray diffraction, Surf. Sci. 215, 555-565, (1989)
Reduction of the X-ray level of DC ion accelerators
W.H. Urbanus, J.G. Bannenberg, F.W. Saris, R. Koudijs, P. Dubbelman, W.A. Koelewijn, Reduction of the X-ray level of DC ion accelerators, Nucl. Instrum. Methods Phys. Res. A 278, 339-348, (1989)
Calorimetric evidence for structural relaxation in amorphous silicon
S. Roorda, S. Doorn, W.C. Sinke, P.M.L.O. Scholte, E.J. Loenen, Calorimetric evidence for structural relaxation in amorphous silicon, Phys. Rev. Lett. 62, 1880-1883, (1989)
Branching ratios and lifetimes for the dissociative decay of triplet H2*
W. Koot, W.J. Zande, P.H.P. Post, J.H. Los, Branching ratios and lifetimes for the dissociative decay of triplet H2*, J. Chem. Phys. 90, 4826-4834, (1989)
Loss of oligomer information in pyrolysis-desorption/chemical-ionization mass spectrometry of amylose, due to the influence of potassium hydroxide
M.A. Scheijen, J.J. Boon, Loss of oligomer information in pyrolysis-desorption/chemical-ionization mass spectrometry of amylose, due to the influence of potassium hydroxide, Rapid Commun. Mass Spectrom. 3, 238-240, (1989)
Steric effects for NO/Pt(111) adsorption and scattering
E.W. Kuipers, M.G. Tenner, A.W. Kleyn, S. Stolte, Steric effects for NO/Pt(111) adsorption and scattering, Phys. Rev. Lett. 62, 2152-2155, (1989)
Epitaxial growth and characterization of Si/NiSi2/Si(111) heterostructures
A. Rizzi, W.F.J. Slijkerman, Epitaxial growth and characterization of Si/NiSi2/Si(111) heterostructures, Surf. Sci. 211/212, 620-629, (1989)