Publication overview
816 publications found in Proceedings
X-ray diffraction from static and growing surfaces
E. Vlieg, J.F. Veen, R. Silfhout, I.K. Robinson, X-ray diffraction from static and growing surfaces, (1992)
Erbium-defect interactions in silica films implanted with MeV Er ions
A. Polman, D.C. Jacobson, J.M. Poate, Erbium-defect interactions in silica films implanted with MeV Er ions, (1992)
A novel process to form epitaxial Si structures with buried silicide
Y.N. Erokhin, R. Grotzschel, S.R. Oktyabrsky, S. Roorda, W.C. Sinke, A.F. Vjatkin, A novel process to form epitaxial Si structures with buried silicide, (1992)
Photoluminescence of erbium in amorphous silicon: Structural relaxation and optical doping
J.S. Custer, E. Snoeks, A. Polman, Photoluminescence of erbium in amorphous silicon: Structural relaxation and optical doping, (1992)
Negative ion extraction from a continuously pulsed high power density volume negative ion source
R.M.A. Heeren, K.N. Mellon, M. Hopkins, D. Ciric, A.W. Kleyn, Negative ion extraction from a continuously pulsed high power density volume negative ion source, (1992)
Epitaxy and nucleation in Cu and Ag doped amorphous Si
J.S. Custer, M.O. Thompson, D.J. Eaglesham, D.C. Jacobson, J.M. Poate, J.R. Liefting, F.W. Saris, Epitaxy and nucleation in Cu and Ag doped amorphous Si, (1992)
Limits to ion beam etching of Mo/Si multilayer coatings
R. Schlatmann, C. Lu, J. Verhoeven, E.J. Puik, M.J. Wiel, Limits to ion beam etching of Mo/Si multilayer coatings, (1992)
Structural relaxation of amorphous silicon induced by high temperature annealing
L. Wit, S. Roorda, W.C. Sinke, F.W. Saris, A. Berntsen, W.F. Weg, Structural relaxation of amorphous silicon induced by high temperature annealing, (1992)
Observation of light scattering from single cylinders: some remarkable conclusions
M.B. Mark, A. Lagendijk, Observation of light scattering from single cylinders: some remarkable conclusions, (1992)
Photodissociation of hydrogen: A subtle probe of collision physics
W.J. Zande, L.D.A. Siebbeles, J.M. Schins, J.H. Los, Photodissociation of hydrogen: A subtle probe of collision physics, (1992)
The energy dependence of ion damage in AlxGa1-xAs/GaAs heterostructures and the effects of implanted impurity
A.G. Cullis, D.C. Jacobson, A. Polman, P.W. Smith, J.M. Poate, C.R. Whitehouse, The energy dependence of ion damage in AlxGa1-xAs/GaAs heterostructures and the effects of implanted impurity, (1992)
Design study of a 1 MV, 4 A, D- test bed in European Community
J. Pamela, R. Hemsworth, H.J. Hopman, C. Jacquot, A.J.T. Holmes, Design study of a 1 MV, 4 A, D- test bed in European Community, (1992)
Surface science and semiconductor processing
F.W. Saris, Surface science and semiconductor processing, (1992)
Ion and X-ray scattering studies of surface disorder
J.F. Veen, R. Silfhout, A.W. Denier van der Gon, Ion and X-ray scattering studies of surface disorder, (1992)
Dislocation engineering for silicon devices
J.S. Custer, J.R. Liefting, R. Schreutelkamp, R.C.M. Wijburg, H. Wallinga, F.W. Saris, Dislocation engineering for silicon devices, (1992)
Dislocation formation in Si implanted at elevated temperature
J.R. Liefting, J.S. Custer, R. Schreutelkamp, F.W. Saris, Dislocation formation in Si implanted at elevated temperature, (1992)
Huygens/ACP: An instrument for aerosols chemical composition measurements.
G. Israel, E. Chassefi, H.B. Niemann, J.J. Boon, F. Raulin, M. Cabane, C. Sabl, Huygens/ACP: An instrument for aerosols chemical composition measurements., (1992)
C implantation for suppression of dislocation formation
J.R. Liefting, J.S. Custer, F.W. Saris, C implantation for suppression of dislocation formation, (1992)
Microscopic aspects of the nematic phases
W.H. Jeu, Microscopic aspects of the nematic phases, (1992)
Avoiding dislocation formation for B, P. and As implants in silicon
J.R. Liefting, V. Raineri, R. Schreutelkamp, J.S. Custer, F.W. Saris, Avoiding dislocation formation for B, P. and As implants in silicon, (1992)