Name :Johan Derks
Email :J.DerksATamolf.nl
Phone :+31-20-7547100
Group :NanoCenter
Publications :Hide publication list

Publications for J. W. Derks


  

Article(s) published in 1997

W.J. Huisman, J.F. Peters, J.W. Derks, H.G. Ficke, D.L. Abernathy and J.F. van der Veen, A new X-ray diffraction method for structural investigations of solid-liquid interfaces, Review of Scientific Instruments 68, 4169-4176 (1997).

Article(s) published in 1989

A. Polman, A.J. Vredenberg, W.H. Urbanus, P.J. van Deenen, H.P. Alberda, H.B. Krop, I. Attema, E. de Haas, H.H. Kersten, S. Doorn, J.W. Derks, J. ter Beek, S. Roorda, R.J. Schreutelkamp, J.G. Bannenberg and F.W. Saris, An MeV facility for materials research, Nucl. Instrum. Methods Phys. Res. B 37/38, 935-940 (1989).

Article(s) published in 1987

P.M.J. Marée, A.P. de Jongh, J.W. Derks and J.F. van der Veen, A system for MBE growth and high-resolution RBS analysis, Nucl. Instrum. Methods Phys. Res. B 28, 76-81 (1987).

Article(s) published in 1986

J.F.M. Westendorp, P.K. Rol, S. Doorn, H.H. Kersten, J. ter Beek, J.W. Derks, F.W. Saris, R. Koudijs and W.J. van Kilsdonk, A UHV system for simultaneous evaporation and ion beam mixing and in situ RBS analysis, Nucl. Instrum. Methods Phys. Res. B 17, 66-72 (1986).