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Publications for M. Seynen
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Article(s) published in 2008 |
| I.M. Taban Barbu, Y.E.M. van der Burgt, M.C. Duursma, Z. Takáts, M. Seynen, M. Konijnenburg, A.J.M. Vijftigschild, I. Attema and R.M.A. Heeren, A novel workflow control system for Fourier transform ion cyclotron resonance mass spectrometry allows for unique on-the-fly data-dependent decisions, Rapid Commun. Mass Spectrom 22, 1245--1256 (2008). |
Article(s) published in 2005 |
| M.J. Rost, L. Crama, P. Schakel, E. van Tol, G.B.E.M. van Velzen-Williams, C.F. Ovegauw, H. ter Horst, H. Dekker, C.B. Okhuijsen, M. Seynen, A.J.M. Vijftigschild, P.Y. Han, A.J. Katan, K. Schoots, R. Schumm, W. van Loo, T.H. Oosterkamp and J.W.M. Frenken, Scanning probe microscopes go video rate and beyond, Rev. Sci. Instr. 76, 053710 1-9 (2005). |
Article(s) published in 2004 |
| T.H. Mize, I.M. Taban Barbu, M.C. Duursma, M. Seynen, M. Konijnenburg, A.J.M. Vijftigschild, C.J. van Doornik, G.J. van Rooij and R.M.A. Heeren, A modular data and control system to impove sensitivity, selectivity, speed of analysis, ease of use, and transient duration in an external source FTICR-MS, Int. J. Mass Spectrom. 235, 243--253 (2004). |